竹内研究室が開発した誤り訂正符号（ECC)技術が日経エレクトロニクスTech-Onに取り上げられました。「ReRAMバッファを備えるSSD向けのECC技術，東京大学が開発」
Media Coverage
2010.09.30
竹内研究室が開発した誤り訂正符号（ECC)技術が日経エレクトロニクスTech-Onに取り上げられました。「ReRAMバッファを備えるSSD向けのECC技術，東京大学が開発」
Department of Electrical and Electronic Engineering, Department of Information and Communication Engineering, The University of Tokyo
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