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Œ€‹†έ”υ (III-V crystal growth)

MOVPE (As,P)
MOVPE

MOVPE(As, P)-Planetary
MOVPE(As, P)-Planetary

MOVPE(Nitrides)
MOVPE(Nitrides)

Atomic Force Microscope
Atomic Force Microscope

Photo Luminescence
Photo Luminescence

Micro-PL
Micro-PL

XRD(Panalytical)
XRD(Panalytical)

XRD(Brucker)
XRD(Brucker)

FT-IR
FT-IR

Ellipsometer
Ellipsometer

Œ€‹†έ”υ (Semiconductor Process)

EB Writer
EB Writer

Mask Aligner
Mask Aligner

Spin Coater
Spin Coater

Confocal Microscope
Confocal Microscope

Optical Microscope
Optical Microscope

DEKTAK Surface Profiler
DEKTAK Surface Profiler

ICP Dry Etcher
ICP Dry Etcher

EB Evaporator (ULVAC)
EB Evaporator (ULVAC)

EB Evaporator (ANELVA)
EB Evaporator (ANELVA)

Sputter (ULVAC)
Sputter (ULVAC)

Sputter (ANELVA)
Sputter (ANELVA)

Quick Au Coater
Quick Au Coater

Anneal Chamber
Anneal Chamber

polisher
polisher

Water Purifier
Water Purifier

Cleaving Stage
Cleaving Stage

Scriber
Scriber

Die Bonder
Die Bonder

Wire Bonders
Wire Bonders

Œ€‹†έ”υ (Device Measurement and Network Experiment)

Scanning Electron Microscope
Scanning Electron Microscope

Automated Fiber Alignment System
Automated Fiber Alignment System

Device Measurement Table 1
Device Measurement Table 1

Device Measurement Table 2
Device Measurement Table 2

Device Measurement Table 3
Device Measurement Table 3

Semiconductor Parameter Analyzer
Semiconductor Parameter Analyzer

Network Experoment
Network Experoment